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National Instruments to Host Measurement and Control Technical Symposiums in 24 North American Cities

National Instruments has opened registration for the 2011 NI Technical Symposium, a series of day-long events that showcase the latest NI technologies and development techniques for engineers and scientists working with measurement and control systems.


The events, which are offered in 24 cities throughout North America from October to December, deliver hands-on training, new product demonstrations, technology exhibitions from National Instruments Alliance Partners and presentations from NI engineers and industry professionals. The program features a morning keynote and more than a dozen technical sessions designed to help engineers increase productivity, reduce costs and optimize their system's performance.


Each NI Technical Symposium delivers technical sessions on the latest NI products for measurement and control applications. Highlights from this year's technical program include hardware-in-the-loop and real-time testing methods, RF vector signal analysis techniques, best practices for using NI LabVIEW system design software and tips for optimizing DC measurements for speed and stability.


NI also introduces LabVIEW 2011 and provides hands-on programming with the LabVIEW Real-Time Module. Additional product trainings cover the new one-slot NI CompactDAQ chassis and next-generation NI Single-Board RIO devices.


"The NI Technical Symposium is an excellent opportunity for engineers of all disciplines and familiarity of NI products to gain insight into the latest NI technologies," said Richard McDonell, director of Americas strategic marketing for National Instruments.


"Attendees not only learn how to use NI technology to develop measurement and control solutions that will help them maintain their competitive advantage, they also learn valuable time-saving techniques through our technical presentations, hands-on learning sessions and interactions with their peers."


Registration is complimentary and open to the public. To learn more and register for the NI Technical Symposium, readers can visit

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